TOFD

Sonotron NDT 专注于研发、制造、营销以及销售独特智能型非破坏测试NDT)设备以及技术,主要用来做超音波、也用在MIA以及涡电流方面。对非破坏测试来说是一种突破。公司的产品颠覆了传统非破坏测试以及发现了更多的可能性。详细资料备索

产品介绍用在 TOFD 检测方面
 

 

 

检测和备份

可携式数字超音波裂缝侦测仪以及记录器
 

·       大的明亮高分辨率触控屏幕

·       内建编码器适配卡

·       USB, LAN, VGA 输出

·       大的数据储存能力

·       长波、切变波、导波、以及表面波

·       A-, B-, CB-, C-, D-, P-Scan以及 TOFD

·       腐蚀剖面以及裂缝成像

·       Up To 20m Length of One Record

·       对记录影像录放 A-Scans

·       增强信号评估做实时以及冻结的A-Scans

·       缺陷尺寸以及样态分析

·       遵守 ASME 以及 RBIM 程序

维独ISONIC 2006 结合多功能以及移动式高绩效的可携式数字超音波裂缝侦测(具备纪录、成像以及数据处理能力的轻巧计算机检测系统,ISONIC 2006 解决了种种超音波检测的难题。
 

·       A 扫描基础检测  使用传统的脉冲回波,背面回音衰减、穿透技术
 

·       直线扫描和记录

§       厚度剖面B-Scan成像以及记录 沿着探头轨迹透过持续的捕捉壁厚数据来完成

§       B-Scan 缺陷断层影像以及记录 做长波以及切变波检测,持续量测反射音波的振幅以及沿着探头轨迹的反射器坐标

§       CB-Scan 垂直平面显示影像以及纪录缺陷 用切变波、表面波、导波检测。透过持续的量测反射音波的振幅以及沿着探头轨迹的反射器坐标

§       TOFD 检测--射频 B-Scan 以及 D-Scan 成像


直线扫描及记录  可以用在:

o      时基模式 (内嵌的实时时钟)

o      True-to-location 模式 (内嵌的增值型编码器接口)


 

·       XY扫描以及记录:

§       (厚度) 绘图的完成是透过沿着探头持续的做壁厚读数

§       裂缝侦测-裂缝的脉冲回音立体成像 (C-Scan, B-Scan, D-Scan, P-Scan)以及记录 利用长波与切变波检测,透过持续的量测回音振幅与沿着探头轨迹的反射器坐标以及可用的附属旋转角度探头。

§       裂缝侦测--穿透 / 背面回声衰减2微平面成像以及记录(C-Scan) is 经由沿着探头轨迹持续的量测单一振幅

§       CB-Scan 缺陷的垂直平面检视成像以及记录 做切变波、表面波、导波检测经由持续的量测回音震幅以及沿着探头轨迹的反射器坐标


XY扫描记录 ISONIC 2006 是内嵌的非接触式有适当的接口的超音波编码控制器。 TOFD 检测可以使用本编码器完成

对于各式的直线扫描以及XY-Scanning 记录 A-Scans可以被沿着探头轨迹的所有探头定位所捕捉到并且倒带并且在后置处理的步骤做离线评估。这个特殊的装置可以用来透过回波动态型态的分析做离线缺陷的特性描述。

做直线扫描中厚度剖面B-Scan数据记录以及做XY扫描腐蚀(厚度)绘图数据记录 ,存在各种风险基础检测的以及维护程序的兼容版本中。

ISONIC 2006
是成功的新款型,就跟知名的 ISONIC 2001款式一样成功,成为世界领导级的多功能可携式超音波测试以及影像设备(2000年到2006),并且得到2004年产品差异化创新的 Frost & Sullivan 奖。  ISONIC 2006ISONIC 2001相比,在携带上以及重量上、电池寿命上、超音波绩效、数据处理处理速度以及人体功学接口上都有显着的改良。

ISONIC 2006 has practically unlimited capacity for storing of:

·       Single A-Scans accompanied with corresponding instrument settings

·       Ultrasonic signal spectrum graphs (FFT) accompanied with corresponding RF A-Scans and instrument settings

·       Various A-Scans sequence records along with corresponding Thickness Profiles, B-Scans, CB-Scans, C-Scans, D-Scans, P-Scans, or TOFD Maps depending on mode of operation selected; each record is accompanied with corresponding instrument settings

ISONIC 2006 complies with requirements of National and International Codes:

§       ASME Section I -Rules for Construction of Power Boilers

§       ASME Section VIII, Division 1 -Rules for Construction of Pressure Vessels

§       ASME Section VIII, Division 2 -Rules for Construction of Pressure Vessels. Alternative Rules

§       ASME Section VIII Article KE-3 -Examination of Welds and Acceptance Criteria

§       ASME Code Case 2235 Rev 9 -Use of Ultrasonic Examination in Lieu of Radiography

§       Non-Destructive Examination of Welded Joints -Ultrasonic Examination of Welded Joints. - British and European Standard BS EN 1714:1998

§       Non-Destructive Examination of Welds -Ultrasonic Examination -Characterization of Indications in Welds. - British and European Standard BS EN 1713:1998

§       Calibration and Setting-Up of the Ultrasonic Time of Flight Diffraction (TOFD) Technique for the Detection, Location and Sizing of Flaws. - British Standard BS 7706:1993

§       WI 00121377, Welding -Use Of Time-Of-Flight Diffraction Technique (TOFD) For Testing Of Welds. - European Committee for Standardization -Document # CEN/TC 121/SC 5/WG 2 N 146, issued Feb, 12, 2003

§       Non-Destructive Testing -Ultrasonic Examination -Part 5: Characterization and Sizing of Discontinuities. - British and European Standard BS EN 583-5:2001

§       Non-Destructive Testing -Ultrasonic Examination -Part 2: Sensitivity and Range Setting. -British and European Standard BS EN 583-2:2001

§       Manufacture and Testing of Pressure Vessels. Non-Destructive Testing of Welded Joints. Minimum Requirement for Non-Destructive Testing Methods -Appendix 1 to AD-Merkblatt HP5/3 (Germany).-Edition July 1989


Download High Resolution PDF Brochure

Technical Data

 

Pulse Type:

Positive Spike Pulse / Positive Square Wave Pulse

Initial Transition:

5 ns (10-90%)

Pulse Amplitude:

Spike pulse - smoothly tunable (18 levels) 50V -400 V into 50 Ω at 4 levels of excitation energy
Square wave pulse - smoothly tunable (18 levels) 50V -400 V into 50 Ω

Pulse Duration:

Spike pulse - 10-0 ns for 50 Ω load depending on Energy and Damping setup
Square wave pulse - 65-00 ns controllable in 5 ns step with driving of both leading edge and trailing edge of the pulse

Energy (Spike Pulse):

4 discrete energy values / 40 μJ (min) to 250 μJ (max) -at 400V amplitude

Modes:

Single / Dual

Damping:

17 discrete resistances values / 25Ω min to 1000 Ω max

Internal Matching Coil -Probe Impedance Matching:

16 discrete inductivity values / 2 μH min to 78 μH max

PRF:

0 -optionally; 15...5000 Hz controllable in 1 Hz resolution

Optional Sync Output / Input:

Max +5V, τ 5 ns, t 100 ns, Load Impedance 50 Ω

Gain:

0...120 dB controllable in 0.5 dB resolution

Advanced Low Noise Design:

93 μV peak to peak input referred to 80 dB gain / 35 MHz bandwidth

Frequency Band:

0.35...35 MHz Wide Band / 34 Sub Bands

Ultrasound Velocity:

300...20000 m/s (11.81-87.4 "/ms) controllable in 1 m/s (0.1 "/ms) resolution

Range:

0.5...3000 μs - controllable in 0.01 μs resolution

Display Delay:

0...3200 μs - controllable in 0.01 μs resolution

Probe Angle:

0-0° controllable in 1° resolution

Probe Delay:

0 to 70 μs controllable in 0.01μs resolution - expandable

Display Modes

RF, Rectified (Full Wave / Negative or Positive Half Wave), Signal's Spectrum (FFT)

Reject:

0...99 % of screen height controllable in 1% resolution

DAC / TCG:

Theoretical -through keying in dB/mm (dB/") factor
Experimental -through sequential recording echo amplitudes from variously located equal reflectors
46 dB Dynamic Range, Slope
20 dB/μs, Capacity 40 points
Available for Rectified and RF Display

DGS:

Standard Library for 18 probes / unlimitedly expandable

Gates:

2 Independent Gates / unlimitedly expandable

Gate Start and Width:

Controllable over whole variety of A-Scan Display Delay and A-Scan Range settings
in 0.1 mm /// 0.001" resolution

Gate Threshold:

5-5 % of A-Scan height controllable in 1 % resolution

Measuring Functions -Digital
Display Readout:

27 automatic functions / expandable; Dual Ultrasound Velocity Measurement Mode for Multi-Layer Structures; Curved Surface / Thickness / Skip correction for angle beam probes; Ultrasound velocity and Probe Delay Auto-Calibration for all types of probes

Freeze (A-Scans and Spectrum Graphs)

o      Freeze All

o      Freeze Peak

o      All signal and spectrum evaluation functions, managing gates and Gain settings are allowed for frozen signals

Encoding:

直线扫描:

o      Time-based (built-in real time clock -0.02 sec resolution)

o      True-to-location (incremental encoder -0.5 mm resolution)

XY Scanning:

o      Airborne Ultrasound (see below)

Airborne Ultrasound Based Encoding Characteristics:

Area of probe manipulation

2000x3000 mm
80x120 "

500x500 mm
20x20 "

200x200 mm
8x8 "

Curvature radius of scanning surface

2000 mm / 40 "

200 mm / 8 "

37 mm / 1.5 "

Scanning Speed

150 mm/s
6 "/s

150 mm/s
6 "/s

150 mm/s
6 "/s

Scan Index

1 to 20 mm controllable in 1 mm step

1 to 20 mm controllable in 1 mm step

0.25 mm; 0.5 mm or 1 to 20 mm controllable in 1 mm step

Resolution for determining of probe coordinates

1 mm / 0.04 "

1 mm / 0.04 "

0.25 mm / 0.01 "

Resolution for determining of probe swiveling angle

-

0.5°

Range of probe swiveling

-

±90°

±90°

Immunity to ambient noise

60 dB

60 dB

60 dB

 

Coupling Monitor:

Built-in controller and interface for Coupling Monitor suitable for any kind of ultrasonic probe at scanning speed up to 150 mm /sec (6 in /sec); resolution -0.5 dB

Testing Integrity Monitoring:

·                        Background imaging of Scanning Plan

·                        Recording and imaging of Actual Probe Trace

·                        Generating perceptible marks corresponding to current coupling degree, probe position, and swiveling angle whilst scanning

·                        Interrupting recording and imaging of actual probe trace if missing coupling and/or probe position and/or swiveling angle

Imaging Modes:

Thickness Profile B-Scan, Cross-sectional B-Scan, Plane View CB-Scan, C-Scan, D-Scan, P-Scan, TOFD -depending on mode of operation selected accompanied with corresponding instrument settings

Imaging Characteristics:

检测

角光束

直线光束

Width of Volume under test

5 to 300 mm controllable in 1 mm resolution -expandable
0.2 to 12 " controllable in 0.01 " resolution - expandable

50 to 2000 mm controllable in 1 mm resolution -expandable
0.2 to 80 " controllable in 0.01 " resolution -expandable

Thickness of Volume under test

5 to 300 mm controllable in 1 mm resolution -expandable
0.2 to 12 " controllable in 0.01 " resolution - expandable

0.5 to 300 mm controllable in 0.1 mm resolution -expandable
0.02 to 12 " controllable in 0.01 " resolution - expandable

Image Resolution

0.5 mm x 0.5 mm x Half Scan Index
0.02 in x 0.02 in x Half Scan Index

0.2 mm x 0.5 mm x Half Scan Index x
0.01 in x 0.02 in x Half Scan Index

Standard Color Scale (Palette)

·                     Pseudo Color

·                     Gray

·                     Thermal

·                     Pseudo Color

·                     Gray

·                     Thermal

User Defined Color Scales (Palettes)

232 colors

232 colors

Signal Amplitude Coloring Protocol

·                     Linear

·                     TCG Normalizing

·                     DAC Normalizing

·                     DGS Normalizing

·                     Customized

·                     Linear

·                     TCG Normalizing

·                     DAC Normalizing

·                     Customized

 

单一直线扫描记录的时间长度:

50-0000 mm (2"-00"), automatic scrolling

Method of Record:

Complete raw data recording

Region of Interest:

Controllable over entire Display Delay, Probe Delay, Range, US Velocity and other appropriate instrument settings

Off-Line Image Analysis:

·                        Recovery and play back of A-Scan captured during scanning

·                        Echo-dynamic pattern analysis

·                        Defects sizing and outlining

·                        Statistical analysis of Thickness / Amplitude data

·                        Converting Record into ASCII/MS Excel®/MS Word® formats

Data Reporting:

Direct printout of Calibration Dumps, A-Scans, Spectrum Graphs, Thickness Profile B-Scans, cross-sectional B-Scans, plane view CB-Scans, TOFD maps, CB-Scans, C-Scans, D-Scans, P-Scans, TOFD Maps

Data Storage Capacity:

·                        At least 100000 sets including calibration dumps accompanied with A-Scans and/or Spectrum Graphs

·                        At least 10000 sets including calibration dumps accompanied with Thickness Profile B-Scans, cross-sectional B-Scans, plane view CB-Scans, TOFD maps, CB-Scans, C-Scans, D-Scans, P-Scans, or TOFD Maps and complete sequence of A-Scans captured during scanning

Data Logger:

Optional -creates and manages database files capable to store up to 254745 records each and organized as 2D matrix; in database every record includes thickness reading accompanied with corresponding raw data A-Scan and instrument setup

On-Board Computer

Pentium M 300MHz

RAM:

128 Megabytes

Flash Memory - Quasi HDD

4 Gigabytes

Outputs:

LAN, USB X 2, PS 2, SVGA

Screen:

6.5" High Color Resolution (32 bit) SVGA 640×480 pixels 133×98 mm (5.24" ×3.86") Sun-readable LCD; Maximal A-Scan Size (working area) -130×92 mm (5.12" × 3.62")

Controls:

Front Panel Sealed Keyboard, Front Panel Sealed Mouse, Touch Screen

Compatibility with the external devices:

PS 2 Keyboard and Mouse, USB Keyboard and Mouse, USB Flash Memory card, Printer
through USB or LAN, PC through USB or LAN, SVGA External Monitor

Operating System:

Windows™ 98SE -instrument operation.
Fully compatible for networking and / or USB connection and off-line data analysis and reporting in external PC running under Windows™ 98SE, Windows™ 2000, Windows™ XP

Power:

Mains - 100-40 VAC, 40-0 Hz, auto-switch; Battery 12V 8AH up to 6 hours continuous operation

Housing:

IP 53 rugged aluminum case with carrying handle

Dimensions:

265×156×121 mm (10.43"×6.14"×4.76") - without battery
265×156×159 mm (10.43"×6.14"×6.26") - with battery

Weight:

3.150 kg (6.93 lbs) - without battery
4.280 kg (9.42 lbs) - with battery

传统的脉冲回波以及穿透 A扫描基础检测

Conventional pulse echo and through transmission A-Scan-based inspection

 

  • 640X480 pixels A-Scan display with physical dimensions 130 x 90 mm (5.12" x 3.62") of working area is largest one for the plurality of portable ultrasonic flaw detectors
  • Combined adjustable spike wave / square wave pulser equipped with variety of probe impedance matching coils provides optimal ultrasound penetration for various materials characterized either by high or low grain, sound attenuation, and the like
  • High frequency probe may not be destroyed occasionally upon connecting to instrument's firing output even if duration of square wave initial pulse is improperly long thanks to probe damage prevention circuit automatically limiting energy transmitted to probe's crystal
  • 46 dB dynamic range 20 dB/µs maximum slope multiple curve DAC/TCG may be created using up to 40 data points to correct distance – amplitude variations of ultrasonic signals
  • Both theoretical and experimental DAC may be activated either through keying in dB/mm (dB/") factor or through sequential recording echo amplitudes from variously located equal reflectors
  • DAC/TCG may be applied to rectified A-Scans (positive, negative, and full wave) and to RF A-Scans as well
  • Built-in DGS data base for standard probes is unlimitedly expandable
  • Thanks to extended dynamic range signals significantly exceeding the A-Scan height (up to 199.9%) may be evaluated without dropping instrument Gain
  • Whilst A-Scan is frozen managing of Gain and Gates settings is still allowed and provides bringing signals to necessary evaluation level and performing required evaluation
  • Dual Ultrasound Velocity Measurement Mode extremely simplifies resolving of sound path distances for dissimilar materials adjacent to each other whereas different values of ultrasound velocity are valid for corresponding signals appearing on the same A-Scan
  • RF display mode combined with frequency domain signal analysis enhances capabilities of the instrument for materials characterization, bond inspection, testing of dissimilar materials, defect pattern analysis, and probes evaluation
  • Optional data logger organizes and manages database files capable to store up to 254745 thickness readings each and organized as 2D matrix. In database every thickness reading is accompanied with corresponding raw data A-Scan and instrument setup. Automatic creating of MS Excel® thickness spreadsheet meets requirements of various Risk Based Inspection and Maintenance (RBIM) procedures
  • And more… see technical data page

 

 

 

 

Thickness Profile imaging and recording is performed through continuous capturing of thickness readings along probe trace:
 

·       Both time-based (real time clock) and true-to-location (built-in incremental encoder interface) mode of data recording are supported

·       Complete sequence of A-Scans is recorded along with thickness profile

·       Off-line evaluation of thickness profile record is featured with:

§       Sizing of thickness damages at any location along stored image: remaining thickness, thickness loss, and length of damage

§       Play-back and evaluation of A-Scans obtained during scanning

§       Off-line reconstruction of thickness profile image for various Gain and/or Gate settings

§       Automatic conversion of thickness profile B-Scan data into MS Excel® thickness spreadsheet meeting requirements of various Risk Based 检测and Maintenance (RBIM) procedures


Typical Application: Corrosion characterization

For Thickness Profile imaging movie example   

On-Line

Off-Line

缺陷的B-Scan断层影像以及记录,利用长波以及切变波做检测,经由持续的量测回音振幅以及沿着探头轨迹的反射器坐标:
 

·       Both time-based (real time clock) and true-to-location (built-in incremental encoder interface) mode of data recording are supported

·       Complete sequence of A-Scans is recorded along with B-Scan defects images

·       Off-line evaluation of B-Scan record is featured with:

§       Sizing of defects at any location along stored image -coordinates and projection dimensions

§       Play-back and evaluation of A-Scans obtained during scanning

§       Defects outlining and echo-dynamic pattern

§       Reconstruction of the B-Scan defects images for the various Gain and/or Reject settings

§       DAC / DGS B-Scan normalization


Typical Applications: Pulse echo
检测of welds, composites, metals, plastics, and the like

For B-Scan cross-sectional imaging movie example click here  

On-Line

Off-Line

Line Scanning XY Scanning

对缺陷做切变波、表面波、导波检测的CB-Scan 垂直平面检视成像 以及记录,透过持续的量测回音振幅以及沿着探头轨迹的反射器坐标:

·       Both time-based (real time clock) and true-to-location (built-in incremental encoder interface) mode of data recording are supported

·       Complete sequence of A-Scans is recorded along with CB-Scan defects images

·       Off-line evaluation of CB-Scan record is featured with:

§       Sizing of defects at any location along stored image -coordinates and projection dimensions

§       Play-back and evaluation of A-Scans obtained during scanning

§       Defects outlining and echo-dynamic pattern

§       Reconstruction of CB-Scan defects images for various Gain and/or Reject settings

§       DAC/DGS CB-Scan normalization


Typical Applications: Long range pulse echo and CHIME
检测of the annular plates and pipes, for pitting, stress corrosion, etc; weld inspection, surface wave 检测


CB-Scan 垂直平面检视成像影片范例请按
here  

在线

离线

CB-Scan imaging of volume under test aside of narrow scanning area is performed through continuous measuring and recording of echo amplitudes, reflectors coordinates, and probe swiveling angle during XY probe manipulating:
 

§       True-to-location data recording is provided through mechanics free airborne ultrasound determining of probe location and swiveling angle

§       Complete sequence of A-Scans is recorded along with real time CB_Scan imaging

§       Off-line evaluation of captured CB-Scan Images and A-Scan distribution data is featured with:

o                       Sizing of defects at any location of scanned volume: coordinates, XY projection dimensions, and area

o                       Play-back and evaluation of A-Scans obtained during scanning;echo-dynamic pattern analysis

o                       CB-Scan image reconstruction for various Gain and/or Reject settings

Typical Application:

Flaw detection and corrosion screening using guided and surface waves; defect outlining using angle beam probes

 

On-Line

Off-Line

TOFD 检测-RF B-Scan以及 D-Scan成像

·       Both time-based (real time clock) and true-to-location (built-in incremental encoder interface and mechanics free airborne ultrasound encoder) mode of data recording are supported

·       Averaging A-Scans whilst recording as per operator's selection

·       Complete sequence of RF A-Scans is recorded along with TOFD map

·       Off-line evaluation of TOFD Map is featured with:

§       Improvement of near to surface resolution through removal of lateral wave and/or back echo record

§       Linearization and straightening

§       Increasing contrast of TOFD images through varying Gain setting and/or rectification

§       Defects pattern analysis and sizing

§       Zoom of TOFD Map and A-Scans


Typical Applications: weld inspection; CHIME inspection

TOFD 检测影像实例,请按 here  
在线

离线

离线

 

Corrosion (thickness) mapping is performed through continuous measuring and recording of wall thickness data during XY scanning

§       True-to-location data recording is provided through mechanics free airborne ultrasound determining of probe location on planar and curved surfaces

§       Complete sequence of A-Scans is recorded along with real time back wall surface rendering

§       Off-line evaluation of captured XY wall thickness and A-Scan distribution data is featured with:

o                       Sizing of thickness damages at any location of scanned surface: remaining thickness, thickness loss, XY dimensions, and area of damage

o                       Play-back and evaluation of A-Scans obtained during scanning

o                       Back wall surface profile reconstruction for various Gain and/or Gate settings

o                       Statistical analysis of XY wall thickness distribution data and its conversion into MS Excel® spreadsheet compatible with various Risk Based 检测and Maintenance (RBIM) procedures

Typical Application:

Corrosion detection and characterization

For movie illustrating principles of corrosion mapping click
here

For movie illustrating corrosion mapping example click
here

 

 

垂直光束检测以及立体数据呈现B-, C-, and D-Scan)是在XY扫描中透过持续回音振幅以及反射器坐标的量测和记录:

 

§       True-to-location data recording is provided through mechanics free airborne ultrasound determining of probe location on planar and curved surfaces

§       Complete sequence of A-Scans is recorded along with real time B-, C-, and D-Scan imaging

§       Off-line evaluation of captured B-, C-, and D-Scan images and A-Scan distribution data is featured with:

o                       Sizing of defects at any location of scanned volume: coordinates, XY projection dimensions, and area

o                       Play-back and evaluation of A-Scans obtained during scanning; echo-dynamic pattern analysis

o                       B-, C-, and D-Scan image reconstruction for various Gain and/or Gate and/or Reject settings

o                       Slicing of C-Scan and D-Scan images

o                       Statistical analysis of B-, C-, and D-Scan image and its conversion into MS Excel® spreadsheet compatible with various Risk Based 检测and Maintenance(RBIM) procedures

Typical Applications:

Weld and base metal angle beam inspection

For movie illustrating principles of straight beam
检测with 3D data presentation click here

 

 

Angle beam inspection with 3D data presentation (P-, D-, and B-Scan) is performed through continuous measuring and recording of echo amplitudes, reflectors coordinates, and probe swiveling angle during XY scanning:

 

§       True-to-location data recording is provided through mechanics free airborne ultrasound determining of probe location on planar and curved surfaces

§       Complete sequence of A-Scans is recorded along with real time P-, D-, and B-Scan imaging

§       Off-line evaluation of captured P-, D-, and B-Scan images and A-Scan distribution data is featured with:

o                       Sizing of defects at any location of scanned volume: coordinates, XY projection dimensions, and area

o                       Play-back and evaluation of A-Scans obtained during scanning; echo-dynamic pattern analysis

o                       B-, C-, and D-Scan image reconstruction for various Gain and/or Reject settings

o                       Slicing of P-Scan and D-Scan images

Typical Application:

Weld and base metal angle beam inspection

For movie illustrating principles of weld
检测and imaging click here